4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Bruce Pember

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Automated alternating current characterization testing

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Automated scan chain sizing using Synopsys

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automated test vector generation and verification

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
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Profile ID: LFUS-PAI-P-2062678

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