4. Optics: measuring and testing
  5. By particle light scattering
  6. With photocell detection

Bernard Faure

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Machine for testing electronic chips

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Makeup case

Cosmetic products and toilet articles – Toilet articles and beauty parlor equipment not elsewhere... – Holder not elsewhere specified
Patent

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Optical apparatus for identifying the individual multiparametric

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Profile ID: LFUS-PAI-P-614681

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