4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Baohong Cheng

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Automatic current trimming method and circuits

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Phase comparison
Reexamination Certificate

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Method for making semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2560046

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