4. Geometrical instruments
  5. Gauge
  6. Movable contact probe, per se

Alexander T Sutherland

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Calibrations of an analogue probe and error mapping

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method of and apparatus for measuring workpieces using a coordin

Geometrical instruments – Gauge – Movable contact probe – per se
Patent

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Method of calibrating a scanning system

Geometrical instruments – Gauge – With calibration device or gauge for nuclear reactor element
Reexamination Certificate

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Method of calibrating a scanning system

Geometrical instruments – Gauge – With calibration device or gauge for nuclear reactor element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-684546

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