4. Optics: measuring and testing
  5. Lamp beam direction or pattern

Alan L. Duncan

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Enhanced multiple instrument distributed aperture sensor

Aeronautics and astronautics – Spacecraft
Reexamination Certificate

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Multi-aperture imaging system

Optical: systems and elements – Compound lens system – Telescope
Patent

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Wavefront sensor for a scanning imager

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Wavefront sensor for a staring imager

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Profile ID: LFUS-PAI-P-675105

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