4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Accelrys Inc.

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Apparatus and method for monitoring the validity of a...

Education and demonstration – Science – Molecular model or display having discrete element...
Reexamination Certificate

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Apparatus and method for monitoring the validity of a...

Education and demonstration – Science – Molecular model or display having discrete element...
Reexamination Certificate

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Linear prediction of structure factors in x-ray crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Methods and systems for estimating binding affinity

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Modeling interactions with atomic parameters including...

Data processing: structural design – modeling – simulation – and em – Electrical analog simulator – Of physical phenomenon
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