4. Optics: measuring and testing
  5. Standard

Aaron Wallack

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Apparatus and method for detecting and sub-pixel location of...

Image analysis – Image transformation or preprocessing – Changing the image coordinates
Reexamination Certificate

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Apparatus and method for detection and sub-pixel location of...

Image analysis – Image transformation or preprocessing – Changing the image coordinates
Reexamination Certificate

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Fast high-accuracy multi-dimensional pattern inspection

Image analysis – Image transformation or preprocessing – Measuring image properties
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Fast high-accuracy multi-dimensional pattern inspection

Image analysis – Pattern recognition – Template matching
Reexamination Certificate

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Fast high-accuracy multi-dimensional pattern inspection

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-439669

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