Abrading – Machine – Combined
Reexamination Certificate
2006-06-20
2006-06-20
Nguyen, George (Department: 3723)
Abrading
Machine
Combined
C451S287000, C451S288000, C451S289000, C451S066000
Reexamination Certificate
active
07063600
ABSTRACT:
The present invention relates to a polishing apparatus for polishing a workpiece such as a semiconductor wafer. The polishing apparatus has a processing section including a polishing section (1) for polishing a semiconductor wafer (6) and a cleaning section (10) for cleaning a polished semiconductor wafer, a receiving section (40) for supplying a semiconductor wafer (6) to be polished to the processing section and receiving a polished semiconductor wafer (6), and a cleaning chamber (20) disposed between the processing section and the receiving section and defined by partitions (102, 103) with shutters (22, 24) which separate the processing section and the receiving section from each other.
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Sekimoto Masahiko
Yoshida Masao
Ebara Corporation
Nguyen George
Wenderoth , Lind & Ponack, L.L.P.
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