Modulated source interferometry with combined amputude & frequen

Details Modulated source interferometry with combined amputude & frequen Modulated source interferometry with combined amputude & frequen

1997-04-22

1998-01-06

Font, Frank G.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356349, 356358, G01B 902

Patent

active

057060843

ABSTRACT:
An improved interferometer is produced by modifying a conventional interferometer to include amplitude and/or frequency modulation of a coherent light source at radio or higher frequencies. The phase of the modulation signal can be detected in an interfering beam from an interferometer and can be used to determine the actual optical phase of the beam. As such, this improvement can be adapted to virtually any two-beam interferometer, including, for example, Michelson, Mach-Zehnder, and Sagnac interferometers. The use of an amplitude modulated coherent light source results in an interferometer that combines the wide range advantages of coherent interferometry with the precise distance measurement advantages of white light interferometry.

REFERENCES:
patent: 5245408 (1993-09-01), Cohen
patent: 5539520 (1996-07-01), Telle

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