Microscopic spectrometer with auxiliary imaging system

Details Microscopic spectrometer with auxiliary imaging system Microscopic spectrometer with auxiliary imaging system

1991-12-26

1993-08-31

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01J 310, G01J 304

Patent

active

052413624

ABSTRACT:
A microscopic spectrometer is disclosed wherein a sample can be irradiated with light from a first light source and either transmitted or reflected through the sample to a spectrometrical measuring system. A half mirror can be detachably provided in the optical system to form two branched optical paths. A second light source can be positioned to irradiate the sample 2 with light through a masking system. The half mirror can transmit the image of the masking system to superimpose it upon the sample and a composite image can then be reflected from the half mirror onto a branched optical path to be observed by the operator. The operator can adjust the actual positions of the masks assembly, while, at the same time, see the entire field of view of the specimen to therefore define in an easy and convenient manner the portion of the specimen to be tested. The respective half mirror and second light source can then be removed prior to performing a spectrometric measurement.

REFERENCES:
patent: 3421806 (1969-01-01), Weber
patent: 3718400 (1973-02-01), Yonekubo
patent: 3740147 (1973-06-01), Kallet
patent: 3887283 (1975-06-01), Merstallinger
patent: 4674883 (1987-06-01), Baurschmidt
patent: 4844617 (1989-07-01), Kelderman et al.

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