Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-03-08
2005-03-08
Tran, Minh-Loan (Department: 2826)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S692000, C438S627000, C438S631000, C438S637000, C438S640000, C438S674000
Reexamination Certificate
active
06864175
ABSTRACT:
The invention relates to a method in which an eclectically nonconductive mask layer is applied to an electrically conductive contact layer which is supported by a substrate layer. A free space is made in the mask layer. Then, a plurality of layers are electrochemically deposited in the free space. Then, layers are applied above the layer which was deposited last. Then, in a removal process, the mask layer is removed down to the height of the top layer.
REFERENCES:
patent: 5256565 (1993-10-01), Bernhardt et al.
patent: 5835314 (1998-11-01), Moodera et al.
patent: 6677165 (2004-01-01), Lu et al.
patent: 6744608 (2004-06-01), Sin et al.
patent: 20030030948 (2003-02-01), Umetsu
patent: 0 913 830 (1999-05-01), None
patent: 0 936 666 (1999-08-01), None
patent: 62103843 (1987-05-01), None
Duvail, et al.;Electrodeposition of patterned magnetic nanostructures: Journal of Applied Physics, vol. 84, No. 11.
Yang, et al.;Shape Evolution of Electrodeposited Bumps with Deep Cavity; J. Electrochem, Soc., vol. 145, No. 9, Sep. 1998.
Engelhardt Manfred
Wurm Stefan
Infineon - Technologies AG
Tran Minh-Loan
Welsh & Katz Ltd.
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