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Indicator for determining the sensitivity of a radiological defe

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Indirect programming of detector framing node

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Industrial computed tomography apparatus

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Industrial inspection method and apparatus using dual energy...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Information theoretic inverse planning technique for...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Information theoretic inverse planning technique for...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspecting coiled tubing for well operations

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection apparatus and method using X-rays

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection cell

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Inspection device

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection device

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection method and system for and method of producing...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Inspection method for soldered joints using x-ray imaging and ap

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection system and method

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection system for air cargoes or vehicles

X-ray or gamma ray systems or devices – Specific application – Absorption
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Inspection system with no intervening belt

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Installation for polymerization by ionization of structures in p

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Installation for producing radiographic layer images

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Instrument and method for focusing X-rays, gamma rays and neutro

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Instrument having X-ray fluorescence and spark emission...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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