LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of inspecting bonded wafers

X-ray or gamma ray systems or devices – Specific application – Absorption

Method of inspecting meat for bone content using dual energy...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Method of iterative reconstruction for energy discriminating...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of making <200 nm wavelength fluoride crystal...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of making and structure of multilayer laue lens for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of making of compound x-ray lenses and variable focus...

X-ray or gamma ray systems or devices – Specific application – Lithography

Method of manufacture of semiconductor devices

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Method of manufacturing a scintillator and a scintillator...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of manufacturing an X-ray optical element for an X-ray an

X-ray or gamma ray systems or devices – Specific application – Lithography

Method of manufacturing X-ray mask and X-ray mask blank, and...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of measurement of abnormal wear debris and particulate co

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of measuring and controlling concentration of dopants...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of measuring layer thickness and composition of alloy pla

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Method of measuring plasma densities and temperatures

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of measuring plating amount and plating film composition

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of measuring the content of given element in a sample by

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of measuring the momentum transfer spectrum of...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Method of non-destructively inspecting a curved wall portion

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Method of non-destructively measuring the pressure of a gas in a