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Selected: W

Wall deposition thickness sensor for plasma processing chamber

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Water in oil measurement using stabilizer

Optics: measuring and testing – Oil testing
Reexamination Certificate

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Water quality monitoring by Raman spectral analysis

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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Wave form filter pulse detector and method for modulated signal

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

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Wave front aberration measuring apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Wave front aberration measuring apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Wave front interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Wave front sensing device

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Wave front sensor

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Wave front sensor

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Wave meter for measuring the wavelength of an optical...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Wave plate retarder

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Wave surface aberration measurement device, wave surface...

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Wave surface characterization

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Waveform sampler

Optics: measuring and testing – Miscellaneous
Patent

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Wavefront aberration measuring instrument, wavefront...

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Wavefront analysis for segmented mirror control

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Wavefront analysis method involving multilateral...

Optics: measuring and testing – By light interference – Having wavefront division
Reexamination Certificate

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Wavefront and intensity analyzer for collimated beams

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Wavefront calibration analyzer and methods

Optics: measuring and testing – Standard
Reexamination Certificate

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