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Inspecting apparatus, image pickup apparatus, and inspecting...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inspecting device for semiconductor wafer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspecting method for disk used in photo film cassette

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Inspecting the surface of an object

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Inspection and retrieval device

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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Inspection apparatus and inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus and inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection apparatus and method, and production method for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus for automatically detecting the unevenness

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Inspection apparatus for containers

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection apparatus for containers with transparent bottoms

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Inspection apparatus for detecting foreign matter on a surface t

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Inspection apparatus for foreign matter and pattern defect

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus for foreign matter and pattern defect

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Inspection apparatus for high temperature environments

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Inspection apparatus for liquid crystal display device and...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Inspection apparatus for pipelines

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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