Augmenting reality system for real-time nanomanipulation...
Automatic atomic force microscope with piezotube scanner
Balanced momentum probe holder
Ball lock punch retainer
Beam tracking system for scanning-probe type atomic force...
Blade wear measuring system
Bonding tool, production and handling thereof
Calibration standard for 2-D and 3-D profilometry in the sub-nan
Caliper method, system, and apparatus
Cantilever and method of using same to detect features on a surf
Cantilever and process for fabricating it
Cantilever chip for use in scanning probe microscope
Cantilever deflection sensor and use thereof
Cantilever for a scanning probe microscope and a method of manuf
Cantilever for atomic force microscope and method of manufacturi
Cantilever for atomic force microscope and method of manufacturi
Cantilever for scanning probe microscope
Cantilever for scanning probe microscopy
Cantilever for use in a scanning probe microscope
Cantilever for use in atomic force microscope and manufacturing