Using an interposer to facilate capacitive communication...

Using hall effect to monitor current during IDDQ testing of CMOS

Using parametric measurement units as a source of power for...

Using parametric measurement units as a source of power for...

Utilizing clock shield as defect monitor

Utilizing clock shield as defect monitor

Utilizing clock shield as defect monitor

UV methods for screening open circuit defects in CMOS integrated

UV methods for screening open circuit defects in CMOS integrated

Vacuum activated backside contact

Vacuum actuated multiple level printed circuit board test fixtur

Vacuum chamber AC/DC probe

Vacuum prober and vacuum probe method

Vacuum test fixture for printed circuit boards

Vacuum-actuated test fixture for testing printed circuit boards

Vacuum-assisted integrated circuit test socket

Variable contact pressure probe

Variable delay circuit, timing generator and semiconductor...

Variable spacing probe tip adapter for a measurement probe

Various electrical characteristics and small test point...