LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Method and apparatus for wafer analysis

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Method and apparatus for wafer-to-wafer control with partial...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Method and apparatus for waveform analysis of physiological...

Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping

Reexamination Certificate

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Method and apparatus for waveform measurement instrument

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method and apparatus for web-based control of a web-based...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Method and apparatus involving a hierarchy of field...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Method and apparatus of capacity learning for computer...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

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Method and apparatus of detecting tool abnormality in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Method and apparatus of determining defect-free...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Method and apparatus of estimating pure spectra and a...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

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Method and apparatus of low power energy detection for a WLAN

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

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Method and apparatus of low power energy detection for a WLAN

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

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Method and apparatus of managing time for a processing system

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate

Reexamination Certificate

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Method and apparatus of predicting a fault condition

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Patent

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Method and apparatus of signal processing for use in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment

Reexamination Certificate

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Method and apparatus of temperature compensation for...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

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Method and apparatus providing concatenated data from...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method and apparatus providing improved data path...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

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Method and apparatus providing improved data path...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

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Method and apparatus providing interleaved data from...

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments

Reexamination Certificate

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