LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

APS based integrated sun sensor

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arbitrary waveform generator with configurable digital...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arbitrary waveform generator with configurable digital...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arc detection and handling in radio frequency power...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arc fault detection for aircraft

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arc fault detection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arc fault detector with circuit interrupter

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Arc fault detector with circuit interrupter

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Architectural power estimation method and apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Architecture for general purpose programmable semiconductor...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Architecture for generating adaptive arbitrary waveforms

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Architecture providing increased information display for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Architectures of sensor networks for biological and chemical...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arcing event detection

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arcing fault detection system using fluctuations in current peak

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Arithmetic unit

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Arrangement and method for the automatic correction of error-con

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

Arrangement for angle measurements

Data processing: measuring – calibrating – or testing – Calibration or correction system

Arrangement for calibrating a vector network analyzer