Reduction of chip carrier flexing during thermal cycling
Reduction of contamination of light emitting devices
Reduction of damage in semiconductor container capacitors
Reduction of damage in semiconductor container capacitors
Reduction of depletion spreading sideways utilizing slots
Reduction of dopant diffusion by the co-implantation of impuriti
Reduction of electromigration in dual damascene connector
Reduction of macro level stresses in copper/low-K wafers
Reduction of metal corrosion in semiconductor devices
Reduction of parasitic effects in floating body mosfets
Reduction of polysilicon stress in trench capacitors
Reduction of reverse short channel effects by implantation...
Reduction of sector connecting line capacitance using...
Reduction of shorts among electrical cells formed on a...
Reduction of silicon oxynitride film delamination in integrated
Reduction of the contact resistance in organic field-effect...
Reduction of topside movement during temperature cycles
Reduction of trapping effects in charge transfer devices
Redundancy fuse block having a small occupied area
Redundancy structure in self-aligned contacts