Reducing relative stress between HDP layer and passivation...
Reducing relative stress between HDP layer and passivation...
Reducing resistance in source and drain regions of FinFETs
Reducing resistivity in interconnect structures by forming...
Reducing resistivity in interconnect structures of...
Reducing resistivity in interconnect structures of...
Reducing reverse short-channel effect with light dose of P with
Reducing shunts in memories with phase-change material
Reducing stress between a substrate and a projecting...
Reducing the actuation voltage of microelectromechanical...
Reducing the actuation voltage of microelectromechanical...
Reducing the contact resistance in organic field-effect...
Reducing the effects of néel coupling in MRAM structures
Reducing the migration of grain boundaries
Reducing the variation of far-field radiation patterns of...
Reduction of ambient-light-reflection in organic...
Reduction of bipolar gain and improvement in snap-back sustainin
Reduction of carrot defects in silicon carbide epitaxy
Reduction of channel hot carrier effects in transistor devices
Reduction of chemical mechanical planarization (CMP)...