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IC protection structure having n-channel MOSFET with n-type resi

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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IC stack utilizing secondary leadframes

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Patent

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IC standard cell designed with embedded capacitors

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular power supply distribution means
Patent

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IC substrate having over voltage protection function

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – On insulating carrier other than a printed circuit board
Reexamination Certificate

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IC substrate with over voltage protection function

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – On insulating carrier other than a printed circuit board
Reexamination Certificate

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IC tag

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Smart card package
Reexamination Certificate

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IC wiring connecting method and apparatus

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Patent

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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ID chip and IC card

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Smart card package
Reexamination Certificate

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Ideal oxygen precipitating silicon wafers and oxygen out-diffusi

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant – Deep level dopant
Patent

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Identical gate conductivity type static random access memory...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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IGBT and free-wheeling diode combination

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate

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IGBT cathode design with improved safe operating area...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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IGBT device with platinum lifetime control and reduced gaw

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor
Patent

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IGBT having a vertical channel

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor
Patent

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IGBT having one or more stacked zones formed within a second...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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