Localized plasmon resonance sensor and examining device

Chemistry: analytical and immunological testing – Involving an insoluble carrier for immobilizing immunochemicals – Carrier is inorganic

Reexamination Certificate

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Details

C385S012000, C385S129000, C385S130000, C422S082110, C435S287200, C435S288700, C435S808000, C436S164000, C436S524000, C436S805000

Reexamination Certificate

active

07906344

ABSTRACT:
The metal fine particles33are sparsely fixed on the surface of the transparent substrate32, and the acceptor35for attaching the specific ligand is immobilized on the transparent substrate32or the metal fine particles33. The prism36is closely attached to the lower surface of the transparent substrate32, and the excitation light enters the transparent substrate32through the prism36. The incident light is totally reflected at the surface of the transparent substrate32, and the evanescent light generated at the surface and the metal fine particles33locally plasmon resonate. As the evanescent light and the metal fine particles locally plasmon resonate, a strong electric field is enclosed in the vicinity of the metal fine particles. When the surface arranged with the metal fine particles33and the acceptor35is contacted to the analysis sample solution containing ligand modified with light emitting molecules, only the light emitting molecule modifying a specific ligand attached to the acceptor emits light.

REFERENCES:
patent: 4877747 (1989-10-01), Stewart
patent: 5527712 (1996-06-01), Sheehy
patent: 6331276 (2001-12-01), Takei et al.
patent: 6-27023 (1994-02-01), None
patent: 11-218491 (1999-08-01), None
patent: 2000-131237 (2000-05-01), None
patent: 2000-356587 (2000-12-01), None
patent: 2001-021565 (2001-01-01), None
patent: 2002-62255 (2002-02-01), None
patent: 2002-116149 (2002-04-01), None
patent: 2002-277397 (2002-09-01), None
patent: 2002-365210 (2002-12-01), None
patent: 2003-121349 (2003-04-01), None
patent: 2003-156504 (2003-05-01), None
patent: 2003-270132 (2003-09-01), None
Patent Abstracts of Japan, Publication No. 2001-021565, Publication Date: Jan. 26, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 2001-116149, Publication Date: Apr. 19, 2002, 1 page.
Notification of Reasons for Rejection for Japanese Application No. 2006-511746 mailed on Sep. 17, 2009 and English translation thereof, 7 pages.
International Search Report for PCT/JP2005/006116 dated Jun. 21, 2005 (2 pages).
Patent Abstracts of Japan 2000-131237 dated May 12, 2000 (2 pages).
Patent Abstracts of Japan 2000-356587 dated Dec. 26, 2000 (2 pages).
Patent Abstracts of Japan 2006-027023 dated Feb. 4, 2006 (2 pages).

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